Electron and X-ray microscopy
نویسندگان
چکیده
منابع مشابه
Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
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Actinide materials demonstrate a wide variety of interesting physical properties in both bulk and nanoscale form. To better understand these materials, a broad array of microscopy techniques have been employed, including transmission electron microscopy (TEM), electron energy-loss spectroscopy (EELS), energy dispersive X-ray spectroscopy (EDXS), high-angle annular dark-field imaging (HAADF), sc...
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Zeolites A, X and HS were synthesized from natural Iranian Kaolinite by alkaline fusion,,followed by refluxing the mixture. The transformation of zeolites X to HS and Y to P were studied at different time intervals by X-ray diffraction and Scanning Electron Microscopy (SEM). It was revealed that in solution, zeolites HS and P are more stable than zeolites X and Y respectively
متن کاملnano-structural characterization of post-annealed zno thin films by x-ray diffraction and field emission scanning electron microscopy
zno thin films were deposited on si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°c). dependence of the crystallographic structure, nano-strain, chemical composition and surface physical morphology of these layers on annealing temperature were studied. the crystallographic structure of films was studied using x-ray diffracti...
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ژورنال
عنوان ژورنال: Nature Materials
سال: 2009
ISSN: 1476-1122,1476-4660
DOI: 10.1038/nmat2424